James Y. S. Tan,1,† Zengguang Cheng,1,2,† Johannes Feldmann,1 Xuan Li,1 Nathan Youngblood,1,3 Utku E. Ali,1 C. David Wright,4 Wolfram H. P. Pernice,5,6 and Harish Bhaskaran1,*
复旦大学程增光研究员，牛津大学Harish Bhaskaran教授
1 Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK
2 Current address: State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433, China
3 Current address: Department of Electrical and Computer Engineering, University of Pittsburgh, 3700 O’Hara St., Pittsburgh, Pennsylvania 15261, USA
4 Department of Engineering, University of Exeter, Exeter, EX4 4QF, UK
5 Institute of Physics, University of Muenster, 48149, Muenster, Germany
6 Center for Soft Nanoscience, University of Muenster, 48149, Muenster, Germany
† These authors contributed equally to this paper.
